In-House Facilities
Experimental Laboratory Equipment & Characterization Systems
Our research facilities include a thin film deposition system, vibrating sample magnetometer, atomic force microscope, X-ray diffractometer, UV-VIS-NIR optical spectrophotometer integrated with a continuous flow helium cryostat for variable temperature measurements (4 K to 500 K), and comprehensive electrical transport measurement setups (resistivity and dielectric properties).
RF Magnetron Sputtering Deposition
- Two 1" and one 2" guns with three dedicated power supplies
- Substrate heater (up to 850 °C)
MiniFlex 600 X-Ray Diffraction System
Rigaku XRD system for structural characterization and crystal phase identification of thin films and bulk samples.
9 Tesla PPMS DynaCool System
- Vibrating Sample Magnetometer (4 K - 400 K)
- DC Resistivity
- Electrical Transport Option
- Fiber Optic Probe
Perkin Elmer Lambda 950 Spectrophotometer
- Wavelength range: 190 nm - 3300 nm
- Three detectors
- Integrated continuous flow cryostat (4 K - 500 K)
Flex Axiom AFM (Nanosurf)
Atomic force microscopy for nanoscale surface morphology and topographical analysis of thin films and nanostructures.
